Home > Products > Scientific Instruments > SR200


Gate Scanner
SR200 — Variable rate gate scannner

  • Gate scanner for SR250 and SR255
  • Forward/reverse scans
  • Repeat/single-shot scans
  • Pen lift output
  • Scan times from 10 ms to 5 minutes
  • Variable scan width control

 

 

 

 


The SR200 Gate Scanner module is designed to automate waveform recovery with the SR250 and SR255 Gated Integrator modules. Waveform recovery is done by slowly scanning the gate of the integrator ver the waveform of interest. Both the SR250 and SR255 modules have external gate delay control inputs. The SR200 provides an adjustable ramp voltage needed to scan the gates using these inputs. The initial and final delays, as well as the scan time, are fully adjustable. Single or repeated scans may be performed in the forward or reverse direction over any portion of the waveform. Scan times from 10 milliseconds to 5 minutes may be selected.

In addition to the delay control output, the SR200 has a 0 to 10 volt X-axis ramp output designed to drive the X-axis of a chart recorder or an oscilloscope.


Specifications
Controls
Reverse/Stop/Forward Selects scan direction or stops scan
Single/Reset/Repeat Selects single/repeated scans or resets to start
Scan time 0.01 to 300 s
Start position 10-turn pot sets the smallest delay in the scan
Scan width 10-turn pot sets the range of delays in the scan
Outputs
Control voltage Rear-panel output connects to the SR250/SR255 delay multiplier input. Impedance <1 Ω, 20 mA
Pen lift Logic signal to lift chart recorder pen or blank an oscilloscope trace
X-Axis Scans between 0 and 10 VDC regardless of start position and scan width setting
General
Power supplies +24 V/20 mA, +12 V/80 mA, -12 V/0 mA, -24 V/20 mA. 2 W
Mechanical Single-width NIM standard module
Warranty One year parts and labor on defects in materials and workmanship



Stanford Research Systems, Inc. • 1290-D Reamwood Ave., Sunnyvale, CA 94089
Phone: (408) 744-9040 • Fax: (408) 744-9049 • email: info@thinkSRS.comwww.thinkSRS.com
© Stanford Research Systems, Inc. 2003